Next Generation Wafer Probing Continues the Infinity family’s Industry leading electrical performance High temperature capability (175° C +) for automotive device characterization and other applications Better tip visibility for enhanced placement accuracy and repeatability Improved tip life/durability with solid rhodium contacts New tip architecture enables support for narrower pitches (e.g. 25um) Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
