Advanced 200 mm semi-/ fully-automated probe system
200 mm Probe Station for Collecting High-accuracy Measurement Data up to 5X Faster
The new Cascade SUMMIT200 advanced 200mm probe system,
is essential for collecting high accuracy measurement data on
single or volume wafers; as fast as possible.
Designed for R&D, device characterization/modelling or niche production
applications, the SUMMIT200 probe station enables precision electrical
measurements over temperature for ultra-low noise, DC, RF, mmW and THz
applications, with semi-automatic and now fully-automatic operation,
for fastest time to accurate data.
